发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT |
摘要 |
PROBLEM TO BE SOLVED: To reduce the rough surface on a side wall of a trench of a trench capacitor by forming the trench capacitor in the shape of a bottle with the lower part of the treanch being larger than the upper part and covering a collar and an epitaxial buried plate from inside with a node dielectric. SOLUTION: A trench capacitor 310 included in a DRAM cell 300 is formed in a silicon wafer substrate 301. A lower part of a trench has a larger diameter or width WL than the diameter or width WU of an upper part. The trench of such a shape is called a bottle trench. And, an epitaxial silicon (epi) layer 365 covers the lower part of the trench below a collar 368 from inside. The epi is doped with an n-type dopant such as As or P and is used as a buried plate of a capacitor. By covering the lower part of the trench by the epi layer from inside, the rough surface to be formed with a node dielectric can be reduced. |
申请公布号 |
JP2000031425(A) |
申请公布日期 |
2000.01.28 |
申请号 |
JP19990178938 |
申请日期 |
1999.06.24 |
申请人 |
SIEMENS AG;INTERNATL BUSINESS MACH CORP <IBM> |
发明人 |
SCHREMS MARTIN;MANDELMAN JACK;HOEPFNER JOACHIM;SCHAEFER HERBERT;STENGL REINHARD |
分类号 |
H01L27/04;H01L21/822;H01L21/8242;H01L27/108;H01L29/94 |
主分类号 |
H01L27/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|