发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To hardly cause diffusion of oxygen and suppress generation of a space charge region and suppress fixed polarization by depositing ferroelectric films of different compositions in layers on a member to form a ferroelectric film by using only one kind of targets by changing sputtering conditions. SOLUTION: In the case that high frequency magnetron sputtering is used, two sputter chambers are prepared. In a first chamber, Pb(Zr0.5Ti0.5)O3 is used as a target. In a second chamber, Pb1.2(Zr0.5Ti0.5)O3 is used as a target. And, a Pt electrode 101 is formed on a silicon substrate integrated with MOS transistors and PZT films 102, 103, 104 are formed continuously in the second chamber, in the first chamber, and again in the second chamber, respectively. Even with one target, a three-layer capacitor can be fabricated by changing the sputtering conditions such as the gas pressure in sputtering.
申请公布号 JP2000031407(A) 申请公布日期 2000.01.28
申请号 JP19990187567 申请日期 1999.07.01
申请人 SEIKO EPSON CORP 发明人 SHIMADA KATSUTO
分类号 H01L21/8247;H01L21/822;H01L21/8242;H01L21/8246;H01L27/04;H01L27/10;H01L27/105;H01L27/108;H01L29/788;H01L29/792 主分类号 H01L21/8247
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