发明名称 MANUFACTURE PROCESS FOR INTEGRATED CIRCUIT HAVING SHALLOW JUNCTION
摘要 PROBLEM TO BE SOLVED: To generate an appropriate coating in an opening having a high aspect ratio by heating a substrate stack to the stack temperature of a specified range, and controlling the stack temperature, an atmosphere and a mutual operation to be self-restrictive ones having self-restrictive thickness smaller than junction depth. SOLUTION: Deposition for generating a desired contact against shallow junction is executed with a condition for generating appropriate self-restrictive effect when deposition is executed on a silicon substrate. Tungsten is deposited in the temperature range of 250 deg.C-600 deg.C Tungsten is appropriately deposited and upper metal such as aluminium is directly deposited on a deposited material or is deposited on the deposited material which is left after tungsten on a surface in a lateral direction is removed. Then, the thickness of a metallic part can be increased. A fixed layer, a tungsten layer deposited with the appropriate condition and the metallic layer of the upper layer such as aluminium if needed are combined.
申请公布号 JP2000031090(A) 申请公布日期 2000.01.28
申请号 JP19990184638 申请日期 1999.06.30
申请人 AT & T CORP 发明人 LIFSHITZ NADIA;SCHUTZ RONALD J
分类号 H01L21/3205;H01L21/28;H01L21/285;H01L21/768;H01L23/52;(IPC1-7):H01L21/28;H01L21/320 主分类号 H01L21/3205
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