发明名称 |
METHOD FOR MANUFACTURING THIN FILM TRANSISTORS |
摘要 |
PURPOSE: A fabrication method of thin film transistors is provided to reduce ON-current and improve threshold voltage by making the distribution of electric field to uniform. CONSTITUTION: The thin film transistor formation method comprises the steps of: forming a gate electrode(21) on a semiconductor substrate(20); forming a first oxide layer(22) and fattening the first oxide layer(22) by CMP; exposing a portion of the gate electrode(21) by wet-etching the first oxide layer(22); forming a nitride spacer(23) at both sidewalls of the exposed gate electrode; forming a first oxide pattern connected between the nitride spacer(23) and the semiconductor substrate(20) by etching the first oxide layer(22) using the gate electrode and the nitride spacer as an etching stopper; forming a gate oxide(24) on the resultant structure; and forming a polysilicon layer on the gate oxide and forming a source(25A), a drain(25B) and a channel(25C) by selective ion-implanting to the polysilicon layer.
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申请公布号 |
KR20000003957(A) |
申请公布日期 |
2000.01.25 |
申请号 |
KR19980025265 |
申请日期 |
1998.06.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
KIM, DO WOO |
分类号 |
H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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