发明名称 PHOTORESIST MONOMER AND ITS PRODUCTION, PHOTORESIST COPOLYMER, PHOTORESIST COMPOSITION, FORMATION OF PHOTORESIST PATTERN AND SEMICONDUCTOR ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide a new compound that bears one or more carboxylic acid an butyl groups and can readily produce a large amount of photoresist resins for electron beams and X-rays in low costs. SOLUTION: This new compound is represented by formula I (R1 and R2 are each H, t-butyl; X is hydrogen, hydroxy, oxygen; n is 1-3), typically 5- norbornene-2-carbony-di-t-butyl malonate. The compound of formula I is prepared by allowing a compound of formula II (R3 is a halogen as chlorine, bromone, iodine or the like or H) to react with a malonic salt of formula III (R4 and R5 are each t-butyl or sodium ion) in a solvent, acidifying the remaining solution after the solvent distillation from the reaction mixture and separating and purifying the organic layer. An example of malonic acid salt of formula III is the sodium salt of di-t-butyl malonate of formula IV.
申请公布号 JP2000026541(A) 申请公布日期 2000.01.25
申请号 JP19990125379 申请日期 1999.04.30
申请人 HYUNDAI ELECTRON IND CO LTD 发明人 LEE GEUN SU;BOK CHEOL KYU;JUNG JAE CHANG;BAIK KI HO;JUNG MIN HO
分类号 C07C57/26;C07C59/46;C07C59/80;C07C69/608;C07C69/732;C07C69/738;C08F22/06;C08F32/00;C08G61/08;G03F7/004;G03F7/027;G03F7/039 主分类号 C07C57/26
代理机构 代理人
主权项
地址