发明名称 TEST METHOD FOR PRINTED CIRCUIT BOARD
摘要 PROBLEM TO BE SOLVED: To provide an optimum test method for a printed-circuit board(PCB), in which the production defect of a high-density PCB is detected in a short period and with good efficiency, in which a test facilitation design is performed from the designing stage of the PCB and which matches with a circuit constitution and a mounting condition. SOLUTION: A CPU 200 which executes designing software used to generate a test program(TP) for a PCB and a hard disk 202 in which the software is stored constitute a computer system. By using the computer system, a TP which can be tested only by an in-circuit tester 204 and which makes a test by using a testing jig according to the circuit constitution and the mounting condition of a PCB to be tested is generated, and a TP which cannot be tested by the tester 204 and which is tested by a flying probe tester 205 is generated. The TP's are transferred to the respective testers 204, 205 via communication lines 210.
申请公布号 JP2000019224(A) 申请公布日期 2000.01.21
申请号 JP19980184664 申请日期 1998.06.30
申请人 HITACHI LTD 发明人 KAJITANI HAYASHI;OTAKI SHIGEO;SUGAWARA SADAYUKI
分类号 G01R31/02;G01R31/28;H05K13/08 主分类号 G01R31/02
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