发明名称 |
METHOD OF FORMING SINGLE SILICON LAYER, MANUFACTURING SEMICONDUCTOR DEVICE, SEMICONDUCTOR SUBSTRATE AND SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To uniformly epitaxially grow an Si layer at low temps. by epitaxially growing a polysilicon or amorphous Si layer or Si of a low-m.t. metal layer with seeds of a substance layer by the cooling treatment to precipitate a single crystal Si layer. SOLUTION: On one main surface of a quartz glass substrate 1 a sapphire thin film 50 is formed on which a polysilicon film 5 is then deposited by the low pressure CVD or plasma CVD method, a metal In film 6 is formed on the polysilicon film 5 by the sputtering or vacuum evaporation, and the substrate 1 is held at high temps. in an H atmosphere to dissolve the polysilicon 5 in a melt of the metal In 6 and gradually cooled to epitaxially grow the Si dissolved in the metal In with the sapphire thin film 50 used as seeds, thus precipitating e.g. a single crystal Si layer 7 of about 0.1μm thick.
|
申请公布号 |
JP2000021790(A) |
申请公布日期 |
2000.01.21 |
申请号 |
JP19980184464 |
申请日期 |
1998.06.30 |
申请人 |
SONY CORP |
发明人 |
YAMOTO HISAYOSHI;YAMANAKA HIDEO;SATO YUICHI;YAGI HAJIME |
分类号 |
H01L21/20;H01L21/208;H01L21/336;H01L29/786;(IPC1-7):H01L21/208 |
主分类号 |
H01L21/20 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|