| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory testing apparatus for shortening a time required for retrieving a singular cell such as a defective cell or the like included in a semiconductor memory. SOLUTION: A singular information holding memory 20 for storing a test result of a semiconductor memory is divided into memory blocks 20a to 20d having the same capacities. An address memory 21 gives the same addresses in the blocks to the respective blocks. A block decision unit 26 decides whether information cells 27a to 27d output from the respective blocks are singular information cells or not to generate logic signals 28a to 28d, and an OR gate 29 sets a singular information detection signal SD to a high level if any is the singular cell. Then, a clock generator 12 once stops a clock CLK, and a retrieving processor 25 obtains an address of the singular cell in the semiconductor memory from the address in the block from an address holder 23 and block identification information from the unit 26. Thereafter, the signal SD is set to a low level, and retrieving is restarted.
|
