发明名称 NONVOLATILE SEMICONDUCTOR MEMORY APPARATUS
摘要 PROBLEM TO BE SOLVED: To prevent a latch-up by impressing an erase voltage to a memory cell well for a predetermined period, erasing the memory cell well and then discharging the erase voltage of the memory cell well by turning two signal lines in a floating state. SOLUTION: An erase voltage of a cell well is discharged while bit lines, cell source lines and all control gates of non-selection blocks not to be erased are kept in a floating state. A cell well discharge circuit CWB2 for discharging the erase voltage of the cell well after data is erased discharges the erase voltage of the cell well with a constant current, thereby preventing a potential of the cell well from decreasing suddenly. A Vcc is impressed to a gate of a transistor TD1 and a Vss is impressed to a gate of a transistor TD2. A transistor HN is controlled to be switched on by a control signal CPWELLVss2 impressed to a gate thereof after the data is erased.
申请公布号 JP2000021186(A) 申请公布日期 2000.01.21
申请号 JP19980187627 申请日期 1998.07.02
申请人 TOSHIBA CORP 发明人 TAKEUCHI TAKESHI;NAKAMURA HIROSHI
分类号 G11C16/02;G11C16/04;H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 G11C16/02
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