发明名称 |
BYPOLAR TRANSISTOR MANUFACTURE METHOD |
摘要 |
PURPOSE: A bipolar transistor manufacture method is provided to reduce a right direction voltage on driving the device by improving an OHMIC contact resistance characteristic between a first semiconductor layer and a collector electrode. CONSTITUTION: The bipolar transistor manufacture method comprises the steps of: a process of forming a n-type second semiconductor layer on a n+-type first semiconductor; a process of forming a p-type third semiconductor layer within the second semiconductor; a process of forming a n-type fourth semiconductor layer within the third semiconductor; a process of selectively doping a n-type impurity in a high concentration only on the back side of the first semiconductor; a process of forming a base electrode at the same time on the second semiconductor; a process of forming the collector electrode on the back side of the first semiconductor.
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申请公布号 |
KR20000003164(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980024329 |
申请日期 |
1998.06.26 |
申请人 |
KEC CORP. |
发明人 |
KIM, JOON SIK;KIM, DONG SOO |
分类号 |
H01L21/328;(IPC1-7):H01L21/328 |
主分类号 |
H01L21/328 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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