发明名称 |
TEST SYSTEM FOR INTEGRATED CIRCUIT PACKAGE USE AND TIMING ERROR MEASURING METHOD THEREOF |
摘要 |
PURPOSE: A test system for an integrated circuit package use is provided to measure a timing error generated from the system itself. CONSTITUTION: The test system for an integrated circuit package use and the timing error measuring method comprise: a test system for an integrated circuit package use(201) having a driver(211), buffers(221, 223), a test signal output unit(231), a response signal input unit(233), a switching device(241), and a receiver(251); a load board(205) having an input terminal(261) and an output terminal(263) and made into a dual transmission line; and an integrated circuit package installing unit(271) for installing the integrated circuit package, placed between the input terminal and the output terminal. |
申请公布号 |
KR20000000940(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980020893 |
申请日期 |
1998.06.05 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD |
发明人 |
KIM, JAE HEE;CHO, SUNG BUM |
分类号 |
G01R31/26;H01L21/66;(IPC1-7):G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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