发明名称 TEST SYSTEM FOR INTEGRATED CIRCUIT PACKAGE USE AND TIMING ERROR MEASURING METHOD THEREOF
摘要 PURPOSE: A test system for an integrated circuit package use is provided to measure a timing error generated from the system itself. CONSTITUTION: The test system for an integrated circuit package use and the timing error measuring method comprise: a test system for an integrated circuit package use(201) having a driver(211), buffers(221, 223), a test signal output unit(231), a response signal input unit(233), a switching device(241), and a receiver(251); a load board(205) having an input terminal(261) and an output terminal(263) and made into a dual transmission line; and an integrated circuit package installing unit(271) for installing the integrated circuit package, placed between the input terminal and the output terminal.
申请公布号 KR20000000940(A) 申请公布日期 2000.01.15
申请号 KR19980020893 申请日期 1998.06.05
申请人 SAMSUNG ELECTRONICS CO., LTD 发明人 KIM, JAE HEE;CHO, SUNG BUM
分类号 G01R31/26;H01L21/66;(IPC1-7):G01R31/26 主分类号 G01R31/26
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