发明名称 POLYCRYSTALLINE SILICON LAYER ETCHING METHOD OF SEMICONDUCTOR APPARATUS USING SILICON NITRIDING FILM
摘要 PURPOSE: A polycrystalline silicon layer etching method is provided to effectively etch the polycrystalline silicon layer of a semiconductor apparatus. CONSTITUTION: The polycrystalline silicon layer etching method of the semiconductor manufacturing process comprises the steps of: forming a silicon nitride film(300) on a polycrystalline silicon layer(200); forming a photoresist pattern(400) on the silicon nitride film(300); forming a silicon nitride film pattern(310) by earthing the silicon nitride film(300); and etching the polycrystalline silicon layer(200) by using the photoresist pattern(400) and the silicon nitride layer pattern(310) as a mask.
申请公布号 KR20000003056(A) 申请公布日期 2000.01.15
申请号 KR19980024152 申请日期 1998.06.25
申请人 SAMSUNG ELECTRONICS CO., LTD 发明人 CHOI, BYUNG YUL
分类号 H01L21/306;(IPC1-7):H01L21/306 主分类号 H01L21/306
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