发明名称 |
POLYCRYSTALLINE SILICON LAYER ETCHING METHOD OF SEMICONDUCTOR APPARATUS USING SILICON NITRIDING FILM |
摘要 |
PURPOSE: A polycrystalline silicon layer etching method is provided to effectively etch the polycrystalline silicon layer of a semiconductor apparatus. CONSTITUTION: The polycrystalline silicon layer etching method of the semiconductor manufacturing process comprises the steps of: forming a silicon nitride film(300) on a polycrystalline silicon layer(200); forming a photoresist pattern(400) on the silicon nitride film(300); forming a silicon nitride film pattern(310) by earthing the silicon nitride film(300); and etching the polycrystalline silicon layer(200) by using the photoresist pattern(400) and the silicon nitride layer pattern(310) as a mask.
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申请公布号 |
KR20000003056(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980024152 |
申请日期 |
1998.06.25 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD |
发明人 |
CHOI, BYUNG YUL |
分类号 |
H01L21/306;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/306 |
代理机构 |
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主权项 |
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地址 |
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