发明名称 METHOD TO TEST EACH PARAMETER LENGTH OF MESSAGE
摘要 <p>PURPOSE: A test method is provided to prevent a parameter length error by testing each parameter length of a message without effect of parameter array. CONSTITUTION: According to the test method, a point number of each parameters of message, and a number of spare areas are acquired. A parameter process is performed when the number of parameter pointer is 1. When the number of parameter pointer is above 1, each parameter pointers are arranged on a reference of the initial parameter values. The first sum value of the initial parameter values is stored. Also, the second sum value of parameter lengths indicated by the arranged pointers is stored. The first and second sum values are compared together. When the first and second sum values are different, the message is discarded. When the first and second sum values are same, the parameter process is performed.</p>
申请公布号 KR20000000649(A) 申请公布日期 2000.01.15
申请号 KR19980020392 申请日期 1998.06.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, CHEOL GI
分类号 H04B17/40;(IPC1-7):H04B17/02 主分类号 H04B17/40
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