发明名称 VOLTAGE WAVEFORM MEASURING PROBE
摘要 PROBLEM TO BE SOLVED: To reduce the input capacity of a probe by suppressing the effects of a stary-capacity caused by a probe-tip electrode and a probe and to install a probe to a crystal with electro-optical effects detachably. SOLUTION: A probe electrode 3 with a capacity coupling part 7 is installed to one end of the electro-optical element 2 of the voltage waveform measuring probe 1 to measure voltage waveforms by detecting a change in the state of polarization of light transmitted through the etectro-optical element 2 with etectro-optical effects. A probe-tip electrode 5 constituting a probe electrode 3 or a needle-shaped electrode 6 is detachably installed to a probe connecting electrode 4 provided on the side of the electro-optical element 2.
申请公布号 JP2000009812(A) 申请公布日期 2000.01.14
申请号 JP19980172366 申请日期 1998.06.19
申请人 FUJITSU LTD 发明人 NAGAI TOSHIAKI
分类号 G01R31/302;H01L21/66;(IPC1-7):G01R31/302 主分类号 G01R31/302
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