发明名称 METHOD FOR FORMING ELECTRODE OF SILICON CARBIDE SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To form an ohmic electrode having low resistance and high temperature stability on a silicon carbide substrate. SOLUTION: A nitrogen implanted resin 3 is formed in a region for forming the electrode of a silicon carbide substrate 1 and a nitride high melting point metal electrode 6 is formed on the upper surface in the region 3. A carbide high melting point metal electrode 9 is formed on the upper surface of the metal electrode 6 and the entirety is annealed to recover crystal defect at each part, activate the electric characteristics of impurities and to alloying the interfaces of the substrate 1 and the electrodes 6, 9. The carbide high melting point metal electrode 9 is used as ohmic electrode for connection with external wiring.</p>
申请公布号 JP2000012486(A) 申请公布日期 2000.01.14
申请号 JP19980175659 申请日期 1998.06.23
申请人 NEW JAPAN RADIO CO LTD 发明人 KIMURA CHIKAO;HONDA KOKI
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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