发明名称 TEST BURN-IN SYSTEM AND TEST BURN-IN SYSTEM CALIBRATING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To automatically adjust a measured current of a test burn-in device by calculating a correction value for appropriately correcting a result obtained from a current measurement circuit at the test burn-in device side, based on a measured current by a diagnosis board mounted in a thermostat. SOLUTION: A current measurement circuit 6 outputs digital data, based on both end voltage of a resistance R to a CPU 8, and a current measurement circuit 4 outputs digital data, based on both end voltage of a current switch circuit 3 to the CPU 8. Then, the CPU 8 calculates a gain correction value for correcting the current measurement circuit 6 and an offset correction value, to transmit them to an adjustment circuit 7. After the adjustment circuit 7 stores the correction value in a memory, it D/A-converts and outputs it to an A/D converter ADC in the current measurement circuit 6 and corrects the digital data outputted from the A/D converter ADC.
申请公布号 JP2000009792(A) 申请公布日期 2000.01.14
申请号 JP19980176251 申请日期 1998.06.23
申请人 ANDO ELECTRIC CO LTD 发明人 SUGIYAMA SHINICHI
分类号 G01R31/26;G01R31/28;H01L21/66;(IPC1-7):G01R31/26 主分类号 G01R31/26
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