发明名称 FIELD EFFECT SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a field effect semiconductor device wherein a threshold voltage varies little even if the thickness of metal constituting a gate electrode disperses, in a device of a constitution wherein metal constituting a gate electrode diffuses to a barrier layer. SOLUTION: In the semiconductor device, an n-type GaAs layer 3 and a barrier layer are formed on a GaAs board 1 one by one, a gate electrode 10 is formed on the barrier layer, and Pt constituting the gate electrode 10 diffuses to a barrier layer. The barrier layer is formed of a first AlGaAs layer 4 and a second AlGaAs layer 5, and the first AlGaAs layer 4 is a semiconductor material wherein Pt is hard to diffuse when compared to the second AlGaAs layer 5.
申请公布号 JP2000012563(A) 申请公布日期 2000.01.14
申请号 JP19980177432 申请日期 1998.06.24
申请人 SANYO ELECTRIC CO LTD 发明人 MATSUSHITA SHIGEHARU;FUJII SHIGEYOSHI;MURAI SHIGEYUKI;TOMINAGA HISAAKI
分类号 H01L29/417;H01L21/225;H01L21/338;H01L29/812;(IPC1-7):H01L21/338 主分类号 H01L29/417
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