发明名称 Process control by transient thermography
摘要 A method and apparatus for detecting, locating, isolating and controlling variations in the manufacturing process by transient thermography. A heat source imparts heat to a surface which is radiated in the infrared region. Infrared sensors are coupled to a processor which tracks the physical characteristics of the sample, and provides feedback to a central process controller to make adjustments to the manufacturing process.
申请公布号 US6013915(A) 申请公布日期 2000.01.11
申请号 US19980021224 申请日期 1998.02.10
申请人 PHILIP MORRIS INCORPORATED 发明人 WATKINS, MICHAEL
分类号 G01J5/48;G01N21/89;G01N21/892;G01N25/72;(IPC1-7):G01J5/02 主分类号 G01J5/48
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