发明名称 |
INSPECTION METHOD FOR SURFACE DEFECT AND INSPECTION DEVICE THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide an inspection method and an inspection device of a shadow mask with high detection sensitivity and easy workability. SOLUTION: This method is an inspection method inspecting a shape-defect of a pattern consisting of a hole part connected to a surface part of a sample 110 that has a periodic pattern placed by periodically repeating a pattern consisting of a hole part with a rough surface part that is connected to a surface of a base material and caved into an inside thereof, and image-processes image data of a shooting image after reflected-lighting a bright field by a diffusion light controlled within predetermined extended angle with relatively moving the sample to a shooting system and shooting a surface of the sample 110 by a imaging means 130 for a line-shape region to get the shooting image, and determines a fillet diameter and/or a projected area of each pattern of the sample 110 to judges with a part of which each value is not within a predetermined range as a defect part.
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申请公布号 |
JP2000002526(A) |
申请公布日期 |
2000.01.07 |
申请号 |
JP19980167905 |
申请日期 |
1998.06.16 |
申请人 |
DAINIPPON PRINTING CO LTD |
发明人 |
HASEGAWA JUN;SHIMIZU SATOSHI |
分类号 |
G01B11/30;G01N21/88;H01J9/42;H01J29/07;(IPC1-7):G01B11/30 |
主分类号 |
G01B11/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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