发明名称 SEMICONDUCTOR CHIP AND SEMICONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To certainly and efficiently make a burn-in, by a method wherein, if a count signal is inputted and a count signal in response to a specified count number is inputted, a reset signal is outputted to at least an integrated circuit. SOLUTION: This embodiment comprises a rest circuit 19 in which, if a count signal of a count circuit 18 is inputted and a count signal in response to a specified count number is inputted, a reset signal is outputted to at least an integrated circuit 10. Thus, a semiconductor chip 2 is reset in every specified period of time. Accordingly, even when the semiconductor chip 2 recklessly drives by any causes in a burn-in period of time ranging over several hours, for example, stops, as it is automatically reset, a specified operation state can be maintained and the burn-in can be appropriately made.
申请公布号 JP2000003945(A) 申请公布日期 2000.01.07
申请号 JP19980167506 申请日期 1998.06.15
申请人 MITSUBISHI ELECTRIC CORP 发明人 MASAO YOSHIKAZU;HONGO KATSUNOBU
分类号 G01R31/26;G01R31/28;H01L21/66;(IPC1-7):H01L21/66 主分类号 G01R31/26
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