发明名称 DEVICE AND METHOD FOR REMOVING PARTICLES IN SEMICONDUCTOR MANUFACTURING DEVICE
摘要 PROBLEM TO BE SOLVED: To efficiently prevent the particles from adhering to a substrate. SOLUTION: In a semiconductor manufacturing device processing a substrate 3000 by impressing a gas with voltage for making the gas plasmatic, the particles positively charged in a processing chamber 2100 are trapped or induced by an electrode 15, a grid 13 and a cover 3600, etc., supplied with a negative a potential as soon as a cathode voltage supply is stopped so as to prevent the particles from arriving at the substrate 3000.
申请公布号 JP2000003902(A) 申请公布日期 2000.01.07
申请号 JP19990131772 申请日期 1999.04.05
申请人 NEC CORP 发明人 MORIYA TAKESHI;ITO NATSUKO;UESUGI FUMIHIKO
分类号 H01L21/302;H01L21/3065;H01L21/31;(IPC1-7):H01L21/306 主分类号 H01L21/302
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