发明名称 WAFER PERIPHERAL ALIGNER
摘要 PROBLEM TO BE SOLVED: To provide a wafer peripheral aligner which can perform accurate step-like exposures along an outer edge of a circuit pattern for a semiconductor wafer peripheral part and can realize easy maintenance and inspection of an exposure light projecting part and a wafer mounting stand. SOLUTION: In a wafer peripheral aligner, which performs step-like exposure along an outer edge of a circuit pattern of a semiconductor wafer and executes maintenance/inspection from a maintenance surface which is one side surface of a device body, an exposure light projection part 3 is arranged in a gate-like supporting stand 2 fixed to a base stand 1, a wafer-counting stand 4 is made movable from a wafer carrying in/out station S1 of a counter maintenance surface side to an exposure treatment station S2 at a maintenance surface side through under a gate-like support stand and a semiconductor wafer is subjected to exposure treatment in an exposure treatment station.
申请公布号 JP2000003850(A) 申请公布日期 2000.01.07
申请号 JP19980179816 申请日期 1998.06.12
申请人 USHIO INC 发明人 NAKAJIMA KOJI;SHIBUYA ISAMU
分类号 G03F7/42;G03F7/20;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/42
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