发明名称 BOUNDARY SCAN TESTER WITH PROBE
摘要 PROBLEM TO BE SOLVED: To inspect manufacturability such as open, short circuits of a printed circuit board by bringing a probe into contact with a pin to be connected to a part having no boundary scan assembled therein, and executing an interconnection test. SOLUTION: A boundary scan is assembled, for example, into an IC 211 mounted on a printed circuit board 21, and no boundary scan is assembled to the connecting counters of its output pin A, 2-way pin B and input pin C. A boundary scan tester 24 is connected to each boundary scan resister 271-275, 276-278 of the IC 211 and a probe connecting part 23 through a boundary scan chain, and a probe 22 is connected to the 2-way pin of the probe connecting part 23. In the inspection of manufacturability of the printed circuit board 21, the probe 22 is brought into contact with a wiring pattern connected to the pin to be tested, and the interconnection test is executed by the boundary scan tester 24. Accordingly, normality or abnormality such as open or short- circuit can be confirmed.
申请公布号 JP2000002751(A) 申请公布日期 2000.01.07
申请号 JP19980169377 申请日期 1998.06.17
申请人 PFU LTD 发明人 MUROTANI TADAHIRO;TERASAKI HIROSHI
分类号 G01R31/02;G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R31/02
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