发明名称 |
OPTOELECTRONIC APPARATUS FOR DETECTING DAMAGED GRAIN |
摘要 |
An optoelectronic apparatus having a measurement region (38) for detecting t he presence of damaged or cracked grain kernels in a population of grain kernel s which are either in a stationary or moving state at the measurement region. The apparatus comprises a short-wave ultraviolet excitation light source (20 ) that emits a spectral line of a wavelength shorter than 300 nm, a non-imagin g photon detector (22), and wavelength selector such as a dichroic beam-splitt er (28) which serves to isolate the fluorescent light emitted in a certain spectral region by the endosperm of grain from the excitation light of the light source, as well as from other sources of light. The apparatus may be mounted in a combine harvester for the purpose of detecting the presence of damaged grain kernels that have endosperm exposed while harvesting. |
申请公布号 |
CA2335480(A1) |
申请公布日期 |
2000.01.06 |
申请号 |
CA19992335480 |
申请日期 |
1999.06.29 |
申请人 |
DEERE & COMPANY |
发明人 |
COOPER, WILLIAM F.;SCHAEFER, TIMOTHY;MERTINS, KARL-HEINZ O. |
分类号 |
A01D41/127;G01N15/06;G01N21/64;G01N21/85;(IPC1-7):G01N21/64;A01D41/12 |
主分类号 |
A01D41/127 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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