发明名称 RESIST MATERIAL AND RESIST PATTERN FORMING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a chemical amplification type resist material capable of improving adhesion property without causing the deterioration of dry etching resistance or sensitivity. SOLUTION: A chemical amplification type resist material contains an acid sensitive polymer having a structural unit, which contains an alkali soluble group protected by a protective group and makes the polymer alkali soluble with the elimination of the alkali soluble group by acid, and an acid generating agent generating an acid by radiation ray exposure. In such a case, the protective group of the acid sensitive polymer is constituted so as to have a part containing at least one nitrile group having self elimination ability.
申请公布号 JPH11352694(A) 申请公布日期 1999.12.24
申请号 JP19980162398 申请日期 1998.06.10
申请人 FUJITSU LTD 发明人 TAKECHI SATOSHI
分类号 G03F7/039;C08F20/34;H01L21/027;(IPC1-7):G03F7/039 主分类号 G03F7/039
代理机构 代理人
主权项
地址