发明名称 |
Test device and method facilitating aggressive circuit design |
摘要 |
A test device is formed on a chip which allows the susceptibility to failure of functional circuitry formed on the chip to be tested. The test device allows aggressive design of chips which include sensitive circuitry, such as precharged dynamic logic, by testing whether deviations from the design specification introduced during manufacturing of the chip are sufficient to cause failure of the functional circuitry.
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申请公布号 |
US6005406(A) |
申请公布日期 |
1999.12.21 |
申请号 |
US19950568743 |
申请日期 |
1995.12.07 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
STORINO, SALVATORE NICKOLAS;WILLIAMS, ROBERT RUSSELL |
分类号 |
G01R31/30;(IPC1-7):G01R31/22 |
主分类号 |
G01R31/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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