| 摘要 |
<p>An improved scan flip-flop and method of using same. The scan flip-flop has a separate dedicated scan output driven by a scan output signal driver. Scan shift race conditions are minimized by providing a weak scan output signal driver and inserting delay elements within a cell for a scan flip-flop in the scan signal path. The use of the improved scan flip-flop allows for a one-pass scan synthesis process which provides accurate flip-flop cell timing and area information during the design process.</p> |
