发明名称 Process for producing a single crystal
摘要 Silicon single crystal production involves doping the growing crystal with specified high nitrogen and low oxygen concentrations. Silicon single crystal production by the Czochralski method involves doping the growing crystal with less than 6.5 x 10<17> atoms/cm<3> oxygen and greater than 5 x 10<13> atoms/cm<3> nitrogen. An Independent claim is also included for silicon single crystal production from a silicon melt, in which the crystal is doped with nitrogen and the quotient V/G(r) is less than 1.3 x 10<-3> cm<2>/min./K at least locally in the radial direction, where V = the crystal pulling velocity and G(r) = the axial temperature gradient at the crystal/melt phase boundary.
申请公布号 EP0962555(A1) 申请公布日期 1999.12.08
申请号 EP19990108645 申请日期 1999.05.12
申请人 WACKER SILTRONIC 发明人 AMMON VON, WILFRIED, DR.;SCHMOLKE, RUEDIGER, DR.;GRAEF, DIETER, DR.;LAMBERT, ULRICH, DR.
分类号 C30B29/06;C30B15/00;C30B15/04;H01L21/322 主分类号 C30B29/06
代理机构 代理人
主权项
地址
您可能感兴趣的专利