发明名称 Methods of manufacturing thin film transistors and liquid crystal displays by plasma treatment of undoped amorphous silicon
摘要 Plasma treatment is performed on an exposed portion of an undoped amorphous silicon layer in a thin film transistor, after etching source/drain contacts and a doped amorphous silicon layer. The plasma treatment can repair damage caused during the etching. The plasma treatment is preferably a hydrogen plasma treatment, and more preferably a helium plasma treatment. These treatments are particularly useful in repairing damage when the source/drain electrodes comprise molybdenum or molybdenum/tungsten alloy, and etching is performed by dry etching the doped amorphous silicon layer using CF4 and HCl gases.
申请公布号 US5998229(A) 申请公布日期 1999.12.07
申请号 US19980017202 申请日期 1998.02.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LYU, CHUN-GI;HONG, MUN-PYO;KIM, SANG-GAB
分类号 H01L21/02;H01L21/285;H01L21/3213;H01L21/336;(IPC1-7):H01L21/00 主分类号 H01L21/02
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