| 摘要 |
<p>The present invention relates to an image sensor with built-in exposure control. It consists of a circuit solution comprising a detector matrix and a processor, in which the exposure time for individual detector elements or arrays of detector elements, such as detector lines, can be controlled individually. One or more detector elements or arrays thereof constitute test areas and are given a significantly different exposure time compared with the major part of the detector elements. The image value from the test area or test areas is then compared with a predetermined threshold value, and the processor utilises this comparison to control the next exposure of the major part of the detector elements.</p> |
