| 摘要 |
The invention provides an evaluation method for a polycrystalline silicon film by which the film quality of a polycrystalline silicon film can be evaluated by a simple method. A silicon oxide film is formed on a p-type silicon substrate, and a photo-resist film having two openings therein is formed on the silicon oxide film. The silicon oxide film is etched to form openings therein, and a polycrystalline silicon film is deposited. Then, arsenic is ion implanted, and heat treatment is performed to form a diffused layer. The polycrystalline silicon film is patterned to form polycrystalline silicon electrodes. A voltage is applied between the polycrystalline silicon electrodes to measure a withstanding voltage and a condition of the diffused layer is recognized, and evaluation of the film quality of the polycrystalline silicon film and an interface condition between the polycrystalline silicon film and the p-type silicon substrate is performed based on the recognition.
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