发明名称 IMPROVED PROCESS FOR PRODUCTION OF THIN LAYERS OF SEMICONDUCTOR MATERIAL
摘要 Thin layers of semiconductor material having a high degree of surface uniformity are produced by: implantation of deuterium ions into a body of semiconductor material to form a buried region of high stress, the buried region defining a thin outer region of the body; attaching a stiffening carrier to the thin outer region of the semiconductor body; and heating the body at 350-450 degrees C to separate the thin outer region. The separated layer is useful in the production of silicon-on-insulator semiconductor devices, and silicon-on-glass devices for liquid crystal display and microwave applications.
申请公布号 WO9960605(A2) 申请公布日期 1999.11.25
申请号 WO1999IB00833 申请日期 1999.05.10
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;PHILIPS AB 发明人 EGLOFF, RICHARD
分类号 H01L21/02;H01L21/265;H01L21/762;H01L27/12 主分类号 H01L21/02
代理机构 代理人
主权项
地址