发明名称 |
IMPROVED PROCESS FOR PRODUCTION OF THIN LAYERS OF SEMICONDUCTOR MATERIAL |
摘要 |
Thin layers of semiconductor material having a high degree of surface uniformity are produced by: implantation of deuterium ions into a body of semiconductor material to form a buried region of high stress, the buried region defining a thin outer region of the body; attaching a stiffening carrier to the thin outer region of the semiconductor body; and heating the body at 350-450 degrees C to separate the thin outer region. The separated layer is useful in the production of silicon-on-insulator semiconductor devices, and silicon-on-glass devices for liquid crystal display and microwave applications. |
申请公布号 |
WO9960605(A2) |
申请公布日期 |
1999.11.25 |
申请号 |
WO1999IB00833 |
申请日期 |
1999.05.10 |
申请人 |
KONINKLIJKE PHILIPS ELECTRONICS N.V.;PHILIPS AB |
发明人 |
EGLOFF, RICHARD |
分类号 |
H01L21/02;H01L21/265;H01L21/762;H01L27/12 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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