发明名称 POWER SUPPLY FOR ELECTROMAGNETIC NOISE MEASURING DEVICE BY CLOSE MAGNETIC FIELD PROBE OR POWER SUPPLY OF INPUT DEVICE UTILIZING THE CLOSE MAGNETIC FIELD PROBE
摘要 <p>PROBLEM TO BE SOLVED: To develop a power supply for utilizing a high-frequency close magnetic field from a surrounding high-frequency magnetic field source, as the power supply of an electromagnetic noise measuring device using a close magnetic field probe or that of an input device which utilizes the close magnetic field probe. SOLUTION: With an electromagnetic noise measuring device using a close magnetic field probe or an input device utilizing the close magnetic field probe, a probe according to a loop coil for a power supply is provided at a traveling part of the device, current generated by the above loop coil and a high-frequency close magnetic field from a close high-frequency magnetic field source is rectified by a rectifying section that is provided at the traveling section, and the current is supplied to a secondary battery that is provided at the traveling part so as to charge it.</p>
申请公布号 JPH11311649(A) 申请公布日期 1999.11.09
申请号 JP19980131031 申请日期 1998.04.27
申请人 RICOH CO LTD 发明人 KO TAIKO;SHINDO YASUYUKI
分类号 G01R33/02;G01R29/08;G01R33/10;G06F3/03;G06F3/033;G06F3/038;G06F3/041;(IPC1-7):G01R29/08 主分类号 G01R33/02
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