发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PROBLEM TO BE SOLVED: To surely prevent malfunctions in a vendor test mode by signal input errors or noise. SOLUTION: In setting a vendor test mode, a command signal is inputted to a specified input terminal, a mode setting signal is inputted to an address terminal, and a vendor test setting signal TS is inputted to a specified address terminal Aa. In a vendor test signal determination circuit 15, a set signal AaSV becomes a Hi signal, only when the vendor test set signal TS is Vcc+ΔV or more, and a mode selecting circuit 18 recognizes that the vendor test mode has been set, based on this set signal AaSV and the mode setting signal, and outputs a selection signal to select the vender test mode.
申请公布号 JPH11304892(A) 申请公布日期 1999.11.05
申请号 JP19980114020 申请日期 1998.04.24
申请人 HITACHI LTD 发明人 MORI MORIHIKO;NISHIMOTO KENJI;KINOSHITA YOSHITAKA
分类号 G01R31/28;G01R31/3185;H01L21/822;H01L27/04 主分类号 G01R31/28
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