发明名称 A metal-insulator-metal capacitor for a dynamic random access memory (DRAM) device
摘要 The starting structure includes two gates and a source/drain region on a substrate. A pitted self-align contact window is etched which exposes the source/drain region. Then successively, a barrier/adhesive layer, a lower capacitor electrode, a dielectric film and an upper electrode are formed in the window thereby obtaining a metal-insulator-metal capacitor which has a shape similar to that of the window. An Independent claim is also included for the capacitor structure.
申请公布号 DE19838741(A1) 申请公布日期 1999.11.04
申请号 DE19981038741 申请日期 1998.08.26
申请人 UNITED MICROELECTRONICS CORP., HSIN-CHU 发明人 HUANG, KUO-TAI;HSIEH, WEN-YI;YEW, TRI-RUNG
分类号 H01L27/108;H01L21/02;H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L27/108
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