发明名称 |
A metal-insulator-metal capacitor for a dynamic random access memory (DRAM) device |
摘要 |
The starting structure includes two gates and a source/drain region on a substrate. A pitted self-align contact window is etched which exposes the source/drain region. Then successively, a barrier/adhesive layer, a lower capacitor electrode, a dielectric film and an upper electrode are formed in the window thereby obtaining a metal-insulator-metal capacitor which has a shape similar to that of the window. An Independent claim is also included for the capacitor structure.
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申请公布号 |
DE19838741(A1) |
申请公布日期 |
1999.11.04 |
申请号 |
DE19981038741 |
申请日期 |
1998.08.26 |
申请人 |
UNITED MICROELECTRONICS CORP., HSIN-CHU |
发明人 |
HUANG, KUO-TAI;HSIEH, WEN-YI;YEW, TRI-RUNG |
分类号 |
H01L27/108;H01L21/02;H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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