发明名称 Electrically erasable nonvolatile memory
摘要 A nonvolatile memory cell which is highly scalable includes a cell formed in a triple wall. The control gate is negatively biased. By biasing the P-well and drain (or source) positively within a particular voltage range when erasing, GIDL current and degradation from a hole trapping can be diminished and hence scalable technology may be achieved.
申请公布号 US5978276(A) 申请公布日期 1999.11.02
申请号 US19980137476 申请日期 1998.08.20
申请人 PROGRAMMABLE SILICON SOLUTIONS 发明人 WONG, TING-WAH
分类号 G11C16/04;G11C16/02;G11C16/14;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C16/04 主分类号 G11C16/04
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