| 摘要 |
Devices and methods are provided to characterize local, small-scale variations in tack build-up, e.g., by measuring tack over areas smaller than 20 mm2, preferably over areas smaller than 1 mm2. These devices and methods measure the tack properties, e.g., tack build-up, of a coating over a very small area, allowing characterization of such small-scale variations. The invention also provides methods for using such characterization to predict back trap mottle (BTM). |
