发明名称 METHOD AND DEVICE FOR INSPECTING AN ELECTRON GUN
摘要 <p>An assembly of electrodes for an electron gun is inspected. The relative positions of a number of apertures (at least three but preferably four) is determined by means of two optical systems, one for determining the positions of two apertures of electrodes, e.g. the G1 and the G2 electrode, the other for determining the position of the other aperture or apertures.</p>
申请公布号 WO1999053515(A1) 申请公布日期 1999.10.21
申请号 IB1999000578 申请日期 1999.04.01
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