发明名称 PROJECTION EXPOSURE APPARATUS AND METHOD, AND REFLECTION REFRACTION OPTICAL SYSTEM
摘要 <p>A projection exposure apparatus comprises an illumination optical system (3) for illuminating a mask (4) on which a pattern is formed and a projection optical system (7) for forming the image of the pattern on a work (8) based on radiation from the mask. The illumination optical system supplies illumination light with a center wavelength of below 180 nm, and the projection optical system has at least one concave mirror, at most 15 refraction lens, and at least 4 aspherical surfaces.</p>
申请公布号 WO1999052004(P1) 申请公布日期 1999.10.14
申请号 JP1999001807 申请日期 1999.04.06
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