发明名称 NON-VOLATILE SEMICONDUCTOR MEMORY
摘要 <p>PROBLEM TO BE SOLVED: To provide a memory which can freely set an erasing block size. SOLUTION: A memory cell array 11 is formed of 128 blocks BLKO to BLK127 and each block has a size (one page×number of serial cells) of 128 kbits (8 kbits×16 cells). At the time of erasing the data, at least one block is selected by row decoders 12-0, 12-1,..., 12-12. A control gate driver 14 gives, at the time of data erasing, the predetermined potential (0 V) to a part of the word lines among a plurality of word lines at least in the selected one block. Thereby, data is erased only for the memory cells connected to a part of the word lines.</p>
申请公布号 JPH11273368(A) 申请公布日期 1999.10.08
申请号 JP19980073877 申请日期 1998.03.23
申请人 TOSHIBA CORP 发明人 OHIRA HIDEKO;IWATA YOSHIHISA;SUGIURA YOSHIHISA
分类号 G11C16/02;G11C16/06;H01L21/8247;H01L27/10;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C16/02;H01L21/824 主分类号 G11C16/02
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