Vorrichtung zum Prüfen von Leiterplatten,申请号DE19896029062-传众专利搜索

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发明名称	Vorrichtung zum Prüfen von Leiterplatten
摘要
申请公布号	DE68929062(D1)	申请公布日期	1999.09.30
申请号	DE19896029062	申请日期	1989.05.02
申请人	OMRON CORP., KYOTO	发明人	KOBAYASHI, SHIGEKI;TANIMURA, YASUAKI;YOTSUYA, TERUHISA
分类号	G01N21/88;G01N21/956;G01R31/309;(IPC1-7):G01N21/88	主分类号	G01N21/88
代理机构		代理人
主权项
地址

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