Testing method and testing apparatus of electronic circuit,申请号EP19980302334-传众专利搜索

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发明名称	Testing method and testing apparatus of electronic circuit
摘要
申请公布号	EP0902298(A3)	申请公布日期	1999.09.29
申请号	EP19980302334	申请日期	1998.03.26
申请人	FUJITSU LIMITED	发明人	MORI, YUTAKA;ISODA, YUTAKA;IWAMOTO, NAOMI;WATANABE, HISASHI
分类号	G01R31/28;G01R31/317;G01R31/3185;G06F11/22;H03K19/00;(IPC1-7):G01R31/318	主分类号	G01R31/28
代理机构		代理人
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