发明名称 |
WAFER STICKING PLATE AND METHOD FOR POLISHING SEMICONDUCTOR WAFER WHILE USING THE PLATE |
摘要 |
PROBLEM TO BE SOLVED: To provide a wafer sticking plate, with which the generation of fine crack on the rear surface of a semiconductor wafer can be prevented and the strength of the semiconductor wafer can be prevented from being lowered after polishing, and a method for polishing semiconductor wafer while using the same. SOLUTION: Concerning a wafer sticking plate 1, the surface coarseness of a face to stick semiconductor wafer 2 is Ra more than 0.0001 μ-m and less than 0.1 μm. Concerning the method for polishing semiconductor wafer, the semiconductor wafer 2 is stuck on the sticking face of the wafer sticking plate 1 having the surface coarseness Ra more than 0.0001 μm and less than 0.1 μm and the surface of the semiconductor wafer 2 is polished. |
申请公布号 |
JPH11265928(A) |
申请公布日期 |
1999.09.28 |
申请号 |
JP19980068888 |
申请日期 |
1998.03.18 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
NISHIURA TAKAYUKI;MESAKI YOSHIO |
分类号 |
B24B37/30;H01L21/304;H01L21/68;H01L21/683 |
主分类号 |
B24B37/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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