| 摘要 |
PROBLEM TO BE SOLVED: To provide a technique for simply evaluating the capability of a photocatalyst film in a short time. SOLUTION: In a method for evaluating the ability of a photocatalyst film 2, its ability is characteristically evaluated by measuring surface potential which changes with light irradiation 3. It is preferable to compare the changes of surface potential measured with an inert gas atmosphere and an atmosphere in which oxygen and steam are present as measuring atmospheres or to compare the changes of surface potential measured with an inert gas atmosphere and an atmosphere in which an object compound to react with as measuring atmospheres. In addition, a device 1 for evaluating the capability of the photocatalyst film 2 is formed of a light source 6 for light irradiation and a surface potential measuring device 4 and is preferably provided with a container or a gas jet nozzle capable of controlling the light source 6 for light irradiation, the surface potential measuring device 4, and gas atmospheres. |
