发明名称 |
High speed, low power dissipation bipolar transistor with a self-aligned epitaxial base is produced |
摘要 |
A bipolar transistor with a self-aligned epitaxial base is produced using a sacrificial emitter core (222) and a spacer ring (225-1) to block dopant implantation into an emitter region during base conversion from intrinsic to extrinsic type. Production of a bipolar transistor with a self-aligned epitaxial base in a substrate structure, having a collector region (202-1) and several insulation structures (204), comprises: (1) successively forming, above the collector region, an intrinsic base region (205) of epitaxial semiconductor material, a sacrificial emitter core (222) and a conformal spacer material layer (225); (2) anisotropically etching the spacer material layer to form a protective spacer ring (225-1); (3) implanting a dopant into the epitaxial base region (205) to form an extrinsic base region, the sacrificial emitter core and the spacer ring blocking the dopant from an emitter region; (4) removing the sacrificial emitter core and the spacer ring; and (5) doping the emitter region. An Independent claim is also included for a semiconductor device including a bipolar transistor with a self-aligned epitaxial base produced by the above process.
|
申请公布号 |
DE19909993(A1) |
申请公布日期 |
1999.09.23 |
申请号 |
DE19991009993 |
申请日期 |
1999.03.06 |
申请人 |
NATIONAL SEMICONDUCTOR CORP., SANTA CLARA |
发明人 |
KOSCIELNIAK, WACLAW C.;EGAN, KULWANT S.;PRASAD, JAYASIMHA S. |
分类号 |
H01L21/331;H01L29/10;H01L29/732;(IPC1-7):H01L21/331 |
主分类号 |
H01L21/331 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|