| 发明名称 |
Digital comparator for semiconductor device inspection system |
| 摘要 |
The output signal from the semiconductor device under test (DUT) is received. A high impedance judging unit (30) judges the high impedance condition of the signal during the entire evaluation time period. |
| 申请公布号 |
DE19908882(A1) |
申请公布日期 |
1999.09.23 |
| 申请号 |
DE1999108882 |
申请日期 |
1999.02.19 |
| 申请人 |
ADVANTEST CORP., TOKIO/TOKYO |
发明人 |
MIURA, TAKEO |
| 分类号 |
G01R31/319;G01R19/165;G01R31/317;G01R31/3193;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/319 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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