发明名称 |
Apparatus for measuring a reflection characteristic |
摘要 |
A reflection characteristic measuring apparatus is provided with a hollow integrating sphere. The integrating sphere is formed with four apertures: a sample aperture where a sample to be measured is placed; a first illumination aperture for allowing light to enter the sphere from a first illuminator; a second illumination aperture for allowing light to enter the sphere from a second illuminator; and a measurement aperture for allowing light to exit from the sphere. A photoreceptor receives light reflected from the sample that exits the measurement aperture. A reflection characteristic calculator is used to for calculating first and second reflection characteristics of the sample based on the light received by the photoreceptor. A corrector is used to correct the calculated first and second reflection characteristics.
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申请公布号 |
US5956133(A) |
申请公布日期 |
1999.09.21 |
申请号 |
US19980179607 |
申请日期 |
1998.10.27 |
申请人 |
MINOLTA CO., LTD. |
发明人 |
IMURA, KENJI |
分类号 |
G01J3/02;G01J1/02;G01J3/50;G01N21/47;(IPC1-7):G01N21/47 |
主分类号 |
G01J3/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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