发明名称 Method and apparatus for replacing a defective integrated circuit device
摘要 An apparatus and method for operatively substituting a replacement device for a defective component in an electrical assembly. The apparatus preferably includes a first primary site adapted to engage a first component, a second primary site adapted to engage a second component, and a replacement site adapted to engage a replacement device. The replacement site has a first dedicated replacement terminal coupled to a first dedicated terminal of the first primary site, and second dedicated replacement terminal coupled to a second dedicated terminal of the second primary site. The replacement site further includes a common replacement terminal coupled to common terminals of both the first and second primary sites. In operation, the replacement device is attached to the replacement site and coupled to the common replacement terminal. Additionally, the replacement device is coupled to the first dedicated replacement terminal if the replacement device is to substitute for the first component. Conversely, the replacement device is coupled to the second dedicated replacement terminal if the replacement device is to substitute for the second component. The primary device for which the replacement device is substituted is also disabled without removing it from the printed circuit board by supply voltage from the component or by applying a supply voltage to a selected connector of the component. For example, when the component is a memory device, a supply voltage may be applied to a +E,ovs RAS+EE terminal of the component to bring the +E,ovs RAS+EE terminal high and effectively disable the component.
申请公布号 US5953216(A) 申请公布日期 1999.09.14
申请号 US19970915190 申请日期 1997.08.20
申请人 MICRON TECHNOLOGY 发明人 FARNWORTH, WARREN M.;DUESMAN, KEVIN
分类号 H05K1/00;H05K3/22;(IPC1-7):H05K7/02;G06F11/00 主分类号 H05K1/00
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