发明名称 Method for producing insulated gate thin film semiconductor device
摘要 An amorphous semiconductor film is etched so that a width of a narrowest portion thereof is 100 mu m or less, thereby forming island semiconductor regions. By irradiating an intense light such as a laser into the island semiconductor regions, photo-annealing is performed to crystallize it. Then, of end portions (peripheral portions) of the island semiconductor regions, at least a portion used to form a channel of a thin film transistor (TFT), or a portion that a gate electrode crosses is etched, so that a region that the distortion is accumulated is removed. By using such semiconductor regions, a TFT is produced.
申请公布号 US5953597(A) 申请公布日期 1999.09.14
申请号 US19960604547 申请日期 1996.02.21
申请人 发明人
分类号 H01L21/20;H01L21/335;H01L21/336;H01L21/77;H01L21/84;H01L27/01;H01L27/12;H01L29/04;H01L29/786;H01L31/0392;(IPC1-7):H01L21/00 主分类号 H01L21/20
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