发明名称 |
Contact element for touch contact with tested microchip |
摘要 |
The contact element (5) is made of 2 different materials, one of which has a higher electrical conductivity for forming a current path (12) through the contact element, the other having good mechanical spring characteristics and acting as a spring device (14) opposing the contact force, which is bent transverse to its longitudinal direction to provide connection points (18) welded to the current path.
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申请公布号 |
DE19821128(C1) |
申请公布日期 |
1999.09.09 |
申请号 |
DE19981021128 |
申请日期 |
1998.05.12 |
申请人 |
FEINMETALL GMBH |
发明人 |
STOEHR, ROLAND;ELSAESSER, MICHAEL;RUPPERT, LADISLAUS;SCHMID, RAINER;GIRINGER, KLAUS;GAUSS, ULRICH |
分类号 |
G01R1/067;(IPC1-7):H01R11/18;G01R31/28 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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