发明名称 Contact element for touch contact with tested microchip
摘要 The contact element (5) is made of 2 different materials, one of which has a higher electrical conductivity for forming a current path (12) through the contact element, the other having good mechanical spring characteristics and acting as a spring device (14) opposing the contact force, which is bent transverse to its longitudinal direction to provide connection points (18) welded to the current path.
申请公布号 DE19821128(C1) 申请公布日期 1999.09.09
申请号 DE19981021128 申请日期 1998.05.12
申请人 FEINMETALL GMBH 发明人 STOEHR, ROLAND;ELSAESSER, MICHAEL;RUPPERT, LADISLAUS;SCHMID, RAINER;GIRINGER, KLAUS;GAUSS, ULRICH
分类号 G01R1/067;(IPC1-7):H01R11/18;G01R31/28 主分类号 G01R1/067
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